SICK Plastic Fibre Optic Sensor 650 mm, 660 mm | LL3-DV07

For any application oriented sensor solution, a suitable fibber optic cable must be chosen. At SICK, the broad range of fibber optic cables made from plastic and glass fibbers permits optimal automation solutions. This applies in particular to tasks for which the fibber optic cable requires application-specific adaption, where flexible cable installation is crucial, where high temperatures prevail, or a particular material compatibility is important. While the fibbers of plastic fibber optic cables are characterized, among other things, by the smallest of bend radii and maximum flexibility, and can also be shortened to any length, the glass fibber optic cables are more chemically resistant and suitable for a higher temperature range.

The wide variety of end sleeve options or individual special sleeves enable virtually any installation possibility. Depending on the application, the fibber optic cable’s protective cladding can be made from plastic, metal, or Teflon for exposure to aggressive chemicals.

Very large selection of plastic and glass fibber-optic cables.

Fibber-optic cables resistant to chemicals and high temperature

Threaded and smooth sleeves, bands of light (array), 90° reflection versions available

Focused optics

Proximity and through-beam versions available

Plastic , protective metal or Teflon sheathing available

Very large selection of fibber-optic cables with plastic and glass fibers, giving users more application flexibility

Resistant to damage caused by mechanical and chemical stress, as well as high temperatures

Standard and customer-specific types

Simple installation saves time

For detection of objects, surfaces, leading edges, and fluid levels

Factory automation

Handling and assembly technology: Quality and position monitoring on conveyor belts

Handling and assembly technology: Safe detection in tight spaces, without interference

Solar: Double layer detection of solar wafers in wafer production

Health care manufacturing: Identification of rack codes and level measurement of test tubes in the Single Lane Analyser

Semiconductor: Quick and accurate wafer detection